2013

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For 2013

Distinguished Lecturer Evaluation

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The Instrumentation and Measurement (I&M) Society is currently accepting applications for new Distinguished Lecturers (DL) for the Distinguished Lecturer Program (DLP).  The DLP provides I&M chapters and technical events around the world with talks by experts on topics of interest and importance to the I&M community. Our lecturers are among the most qualified experts in their field. More details on the DLP can be found at: http://www.ieee-ims.org/education/distinguished-lecturers-program.

There will be a Distinguished Lecturer Evaluation at I2MTC 2013 in Minneapolis, MN. The Evaluation will take place at The Depot, in the Soo Line Room, on Tuesday, May 7, 10:15 am. This is a schedule change!!!!  Interested parties are encouraged to contact Kristen Donnell for more information.

 

To apply to serve as an IMS Distinguished Lecturer, please submit the following information to Kristen Donnell.

 

·         Proposal title

 

·         Presenter's name, affiliation, references

 

·         Abstract of the presentation topic (between 500 and 1000 words)

 

·         A biography from the presenter limited to 150 words

 

Please note that each evaluation presentation must be no longer than 12 minutes. Each candidate will be allowed 15 minutes total to present, including set-up of the presentation and a Q&A session. Presenters may use PowerPoint slides and may provide other visual aids, if so desired. Each speaker will be evaluated on his/her ability to convey the subject material, provoke interest in the subject in a broad audience of scientists, engineers, and students, and keep to the guidelines.

 

Please view the Distinguished Lecturer Program 2013 Call for Applications.

 

Exhibitor Information

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Overview

• We expect around 350 of the top instrumentation and measurement experts in the world

• The Minnesota I&M Chapter is focused on industrial rather than academic engineering

• The venue is downtown Minneapolis, in the “heart” of Minnesota’s “Medical Alley”

• Exclusive access to elite engineers from local companies and international organizations

• An ideal opportunity to meet prospective customers and potential employees

• A great location, at the historic Marriott Depot Renaissance Hotel and Convention Center

 

Exhibitor Kit  - Click to download

The Details

• The I2MTC Conference runs four days and the exhibits are Tuesday-Wednesday, May 7-8
• Exhibit area is 16ksf Pavillion hall, along with poster presentations and break stations
• Exhibit set-up day is Monday, May 6, from Noon to 5pm
• Exhibit hours are 10am to 6pm on Tuesday and 9am to 4pm on Wednesday
• Exhibit spaces are 10’x10’ and include a draped 6’ table, 2 chairs, carpeting and AC power
• Multiple spaces may be purchased, but table-top display format is preferred
• You may set up your own booth, union help not required
• Exhibits may be dismantled and removed after 4pm on the 8th of May
• Two exhibitor booth-credentials are included
• A one-half price conference attendance coupon is included
• Morning and afternoon break refreshments are included
• Banquet-meals and entertainment are not included, but tickets may be purchased on-site
• The Mississippi Riverboat welcome cruise on Tuesday evening is included
• A splash ad in the conference proceedings is included – please submit details with contract
• Each 10’x10’ space costs $900, all-inclusive
• Booth location priority is based on date of payment receipt

 

Please fill out the Exhibitor Contract and send in with your payment to reserve a spot on the Exhibit Floor!

For more information, contact Exhibits Chair, Scott Sandstrom.  (612) 701-2495.

Special Sessions

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"Emerging Methods for Measuring, Modeling and Instrumentation in Medical Applications"

Session Synopsis:  Improving the measurement quality of physiological parameters is increasing in popularity. Various examples of such complex measurements are widely available such as blood pressure meters, glucose sensing, vital signs of fetus, and heart rate monitoring.  On top of that medical imaging like PET, MRI and EEG-scans requires measuring physiological processes (e.g. blood-hemodynamic) for simulation and prediction purposes. To improve the quality of medical applications, innovative modifications are needed on different levels: instrumentation, measurement techniques, signal processing and modeling. 

This special session invites articles that deal with innovative solutions to:

•    measurement and modeling of physiological parameters and processes
•    medical imaging
•    uncertainty and traceability of medical measurements
•    medical instrumentation and calibration techniques
•    personal healthcare
•    healthcare management

Organizers:  Wendy Van Moer, Vrije Universiteit Brussel, Belgium; and Kurt Barbé, Vrije Universiteit Brussel, Belgium

Invited Speaker:  Guy Nagels

"Measurement and instrumentation: engineering challenges in biomedical applications"

Abstract: Both clinical practice and biomedical research increasingly benefit from measurement and instrumentation technologies. In diagnostic applications, data acquisition through imaging techniques, electrophysiological measurements and biochemical sampling immediately come to mind. Diagnosis may in some cases also be supported by different machine learning techniques. Patient management sometimes necessitates instruments for drug delivery or electrical stimulation, both external and implanted. Less invasive technologies are also being used to enhance patient compliance with prescribed therapies, and both standard and dedicated computer platforms are being used in rehabilitation strategies. In biomedical research, several of these techniques return, and in addition more destructive protocols involving measurement and instrumentation can be applied. This presentation will aim to give a broad overview of problems faced by clinicians and biomedical scientists, for which engineers may provide measurement and instrumentation solutions in the future. Some examples of current applications will also be discussed.

When submitting your extended abstract for this special session, please identify that it is being submitted for “special session #2”.  For more information about this special session please contact Wendy Van Moer.


"Microwave, Millimeter Wave, and Terahertz:  Devices, Methods, Applications, and Measurements"

Session Synopsis:  In the past decade, there has been a significant flurry of activity in the millimeter, sub-millimeter, and terahertz (THz) regions of the electromagnetic spectrum regarding device development, new measurement methods, and a wide range of novel applications. These regions in particular have received considerable attention by academicians, practioners, and those interested in advancing the technology of these up-and-coming areas. This session aims to provide a forum to showcase some of the state-of-the-art activities while bringing researchers with similar interests together.

Organizer:  Dr. Kristen M. Donnell – Missouri University of Science and Technology (S&T), Rolla, MO, USA

Invited Speaker:  Dr. Dylan Williams – National Institute of Standards and Technology (NIST, Boulder, CO, USA)

“On-Wafer Measurements at THz Frequencies”

Advances in semiconductor fabrication have pushed the development of the microwave wafer probes and vector network analyzers for transistor characterization at terahertz frequencies. Dr. Williams will discuss the synergy between advances in transistor technology and microwave metrology, the fundamental advances in transistor characterization over the last few years, and the challenges that await us. 

For more information about submitting an abstract to this special session, please contact Dr. Kristen Donnell.


"Wireless Sensors Networks for Assisted Living"

Session Synopsis:  Assisted Living is a hot area having an everyday increasing strategic relevance given its impact on the economy and on the society. In this sector, measurement systems and methodologies assume a role of primary importance.  There is, in fact, an extremely vivid interest on this subject both in the scientific and in the industrial community.  In spite of the numerous results available, there is still a large need for further research efforts and for novel solutions.  In particular Wireless Sensors Networks hold the promise of being able to bring innovative contribution to this area being able to collect and transfer large sets of measurement data from several points thus realizing distributed and flexible measurement systems.  We invite therefore original research papers on this subject with the goal to contribute to this area through a vibrant arena where novel ideas on converging subjects for the general topic of “Wireless Sensors Networks for Assisted Living” will be confronted and exchanged between prominent actors in this field.  

Submission are welcomed on:
•    Overview of state of the art on "WSN for assisted living"
•    Measurement methodologies and algorithm for Wireless Sensors Networks
•    Applications of Wireless Sensor Networks to the improvement of life quality of impaired people
•    Smart wireless multi-sensor systems for assisted living
•    Smart textile solutions for Body Sensor Networks
•    Wireless Body Sensor Network
•    Energy harvesting solutions for Wireless and Body Sensor Networks

Organizers:  Salvatore Baglio, DIEEI – University of Catania, Italy; and Bruno Andò, DIEEI – University of Catania, Italy

Invited Speaker:  Subhas Mukhopadhyay, Massey University, New Zealand

When submitting your extended abstract for this special session, please identify that it is being submitted for “special session #4”.  For more information about this special session please contact Salvatore Baglio.


"Technology Transfer & Expert Panel Discussion"

Session Synopsis:   Over the past few decades technology transfer of intellectual property (IP) to successful commercialization has become increasingly important in the research university environments. This is primarily due to increase in job creation and fostering local and regional economic development. University administrators and research sponsoring agencies view university technology transfer (from research laboratories to commercialization) as a significant source of income and an important research output metric, respectively. Commercial entities are keenly aware of the importance of this issue and highly sensitive to timely recognition and protection of their IP.  However, not everyone involved in this process, including university academic faculty members, and graduate students, are aware of the importance of IP generation and protection. The purpose of this session is to familiarize the participants with not only the basic fundamentals of patent filing and execution, but also with common processes used in universities to protect such IP and its effective transfer to the marketplace through licensing agreements. Other important issues such as the governing laws will also be addressed in this session. Several “successful” and “unsuccessful” case studies highlighting the challenges, risks and rewards of Technology Transfer will be presented followed by a moderated “Expert Panel Discussion” engaging the participants in Q/A with the panel members.

Who should attend:    University faculty members, graduate students, scientists and engineers from industry and governmental agencies, and anyone interested in this important topic.

Organizer:   Professor Reza Zoughi – Missouri University of Science and Technology (S&T), Rolla, MO, USA

Invited Speakers:   

Mr. Keith Strassner - Director of the Office of Technology and Economic Development at Missouri University of Science and Technology, Rolla, MO, USA

Mr. Strassner’s main responsibility is focused on expanding the economic footprint of the University through commercialization of the University’s Technology assets via licenses, partnerships and entrepreneurial activities, including development of Missouri S&T’s Innovation Park. He represents the University as a board member of the Rolla Regional Economic Commission (RREC) and on the Board of Directors of Missouri Enterprise. Prior to joining the University he served as Assistant Director for Alliances at Brewer Science, Inc. responsible for the identification and development of strategic alliances and partnerships leading to the creation new business opportunities. This included a key role in the formation of the Jordan Valley Innovation Center at Missouri State University (Springfield, MO) designed to commercialize University and Industrial technology. He also served as Brewer’s key liaison with Missouri’s Congressional offices and the Department of Defense contracting agencies. Prior to joining Brewer Science, he spent 16 years with Petrolite Corporation, a specialty chemical company based in St. Louis, MO and Tulsa, OK, holding a variety of technical, business development and marketing positions including Manager of New Business Development and R&D Director. Keith Strassner holds a Bachelor of Science in Chemistry from the Missouri University of Science and Technology (1979) and a Masters of Arts in Marketing from Webster University (1988).

John W. Sheets, Jr., Ph.D., Senior Vice President, Corporate Research, for Boston Scientific Corporation.

In this newly created position, John leads Boston Scientific’s research function. He has established a renewed strategic direction for product and technology research activities while acting as an agent for change within the broader development organization to help advance the Company’s Corporate Technology Plan and White Space Strategy.

Prior to joining Boston Scientific, John served as Corporate Vice President of Research and Development and Chief Technology Officer at Bausch & Lomb, leading the company’s global research and development function for its Vision Care, Pharmaceutical and Surgical business units. He directed efforts that led to 20 new product launches, which grew the company’s pipeline value by 140 percent. 

Earlier, John was President and Chief Executive Officer of Hoya Surgical Optics, a global ophthalmic surgical business. He established Hoya’s global headquarters in the United States, which included identifying and hiring an executive team, creating a global brand and developing product positioning strategies. Prior to this role, John was Worldwide Vice President, Research and Development and Chief Technical Officer at Ethicon, a Johnson and Johnson company, where he established strategies for expansion in biosurgicals, ENT and plastic surgery. From these initiatives, he led the growth of Ethicon’s new product revenues by more than 25 percent.    

During his tenure as Vice President, Surgical IOL and Therapeutics at Alcon Laboratories, he lead the establishment of the Acrysof IOL platform which commands over a 50% global market share.  During his tenure, Alcon established itself as the market leader in surgical ophthalmology.

John earned Ph.D. and M.S. degrees in Materials Science and Engineering from the University of Florida, where he earlier earned a B.S. in Zoology. He has been recognized as the inventor on 12 U.S. patents involving ophthalmic, bariatric and general surgery products. He was recently elected as a Fellow of the American Institute for Medical and Biological Engineering.


"RF/Microwave Materials Characterization"

Session Synopsis:  This session is a unique opportunity for scientists and engineers to present their latest research findings in the field of RF and microwave characterization of materials. Topics of interest for this session include, but are not limited to, measurement techniques, calibration methods, measurement uncertainties, modeling and parameters extraction, and applications.

Organizer:  Dr. Samir Trabelsi – US Department of Agriculture, Athens, GA

Invited Speaker: Jan Obruzut - The National Institute of Standards and Technology (NIST)

For more information about submitting an abstract to this special session please contact Dr. Samir Trabelsi.


"Instrumentation and Measurement for Improving Quality, Reliability and Safety"

Session Synopsis:  Nowadays, in many fields of application, it is mandatory to fulfil performance of Testing and Diagnostics, Reliability, Availability, Maintainability, Safety and Risk assessment. Such tasks are considered, in fact, as fundamental in different contexts of high-tech industry (e.g. biomedical, transportation, logistics, avionics) as well as for the environment, materials, plants, etc.

This Special Session represents an interesting opportunity for engineers and researchers who work in this area to meet about live issues. In particular, useful and beneficial discussion can be promote with the aim to provide an increasing of  knowledge and an easier diffusion of the most recent developments.

Perspective authors can provide original contributions in this topic which can cover, but not only, the following aspects:

-    Instrumentation and measurement methods for Testing and Diagnostics (Destructive and Non-destructive Testing, Condition Monitoring, Vibration monitoring, Built-in Test Equipment and Automatic Test Equipment, etc.)
-    Design and implementation of laboratory tests (Reliability test, Environmental test, Burn-in test, quality tests, etc.) and Qualification tests for components, assemblies and process
-    Measurements, methods and instrumentation for evaluation of Reliability, Availability, Maintainability and Safety (RAMS), improvement and assurance
-    Impact of RAMS requirements in the emerging technologies for Life and Society, environment and new energy sources
-    Effects of measurement uncertainty on the estimation of the RAMS parameters
-    Risk assessment and management
-    Reliability and Quality growth
-    Standards definition and certification

Organizers:   Marcantonio Catelani, University of Florence (Italy); Loredana Cristaldi, Politecnico of Milan (Italy); Massimo Lazzaroni, University of Milan (Italy); Lorenzo Peretto, Paola Rinaldi, University of Bologna (Italy); Ferdinanda Ponci, RWTH Aachen University (Germany); Andrea Fibbi, Stefano Rossin, Carmelo Accillaro, GE Oil & Gas (Italy); Enrico Simoni, Borri S.p.A. (Italy); and Giorgio Turconi, IEC TC 56 (Dependability) Member and Secretary of Italian TC 56 (Italy)

When submitting your extended abstract for this special session, please identify that it is being submitted for “special session #9”.  For more information about this special session please contact Professor Marcantonio Catelani.


"Advanced Measurement and Data Processing for Engineering System Health Monitoring"

Session Synopsis:  Engineering system health monitoring has attracted increasing attention in both academic and industrial communities. Dynamical changes of engineering systems have to be captured in time for safe and reliable operations. These tasks are typically realized by using measurement technologies in combination with data processing algorithms. Recent advances in the theory and methodology for measurement and data processing have provided viable tools to dealing with the issue of engineering system health monitoring. This invited session is seeking for papers on recent research and development on engineering system health monitoring with theoretical and/or applied nature. Suitable topics for this special session include but are not limited to:
•    New measurement methodology for system health monitoring
•    Wireless sensor networks
•    Advanced time scale/frequency analysis
•    Non-linear time series analysis
•    Other-related topics.

Organizers:  Dr. Ruqiang Yan, Southeast University, China; Dr. Xuefeng Chen, Xi’an Jiaotong University, China; Dr. Zhaoyan Fan, University of Connecticut, USA

Invited Speaker:  Dr. Robert X. Gao – University of Connecticut, USA

“Advanced Measurement for Advanced Manufacturing: Challenges and Opportunities”

The rapid advancement in material science and technologies since the beginning of the 21st century, as represented by nano-materials, has stimulated new interests world-wide in advanced manufacturing. As the foundation for economic development and wealth production, manufacturing continues to play a pivotal role in the era of information technology. At the same time, the continued convergence of engineering science with information, communication, and miniaturization technologies has accelerated the long-standing research and development in measurement science, placing it at the verge of significant growth in the new global economy.  Innovative sensing and signal processing methodologies have been continually invented and explored for improving the observability and controllability in manufacturing systems and process monitoring, diagnosis, and prognosis.

This invited talk summarizes recent advancement in measurement science and instrumentation for enhancing health monitoring and diagnosis of manufacturing equipment and processes. Methods for self-energized and wireless multivariate sensing are highlighted, and energy-efficient data acquisition and transmission methods are described. Such methods have potential applications in designing energy efficient wireless sensor networks for complex manufacturing systems. The talk highlight both challenges and opportunities in integrating sensing, multi-physics modeling, and embedded control for innovative applications in advanced manufacturing

For more information about submitting an abstract to this special session please contact Dr. Ruqiang Yan.

Keynote Speakers

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Kevin E. Bennet
Chairman, Division of Engineering, Mayo Clinic

"Next Generation Deep Brain Stimulation: Collaborative Engineering Solutions"

Tuesday, May 7, 2013

Kevin Bennet PhotoMr. Kevin E. Bennet is the Chairman of the Division of Engineering of the Mayo Clinic of Rochester, Minnesota, Assistant Professor of Neurosurgery and co-Director of the Neural Engineering Laboratory of Neurologic Surgery.  His division, composed of 64 technical staff, is responsible for the development and application of new technology for clinical practice and research.  Major development efforts include deep brain stimulation, wireless physiological monitoring and minimally invasive surgery.

Mr. Bennet joined the Mayo Clinic in 1990 with current and past appointments as Chair of Strategic Alliances, Vice Chair of Information Technology Standards & Architecture Subcommittee, Clinical Practice Committee Equipment Subcommittee, Information Technology Coordinating Executive Committee, Pharmacy and Therapeutics Committee, Medical/Industry Relations Committee as well as chair and membership in various workgroups and taskforces.  He has also served as a reviewer of Mayo Clinic Proceedings and the NIH Small Business Innovation Research program.

He has over 30 years of experience in technology development with organizations including W.R. Grace & Co., Exxon International and Amoco Chemicals.  He has been a consultant to the National Institutes of Health and served on NIH site visit teams.  He holds patents concerning semiconductor and optical technology has founded several technology-based companies.

Mr. Bennet received a Bachelor of Science degree in Chemical Engineering from the Massachusetts Institute of Technology and a Masters of Business Administration from Harvard Business School.


Susan C. Hagness
University of Wisconsin-Madison

"Microwave Breast Imaging:  A New Mammography?"

Tuesday, May 7, 2013

Susan Hagness PhotoSusan C. Hagness received the Ph.D. degree in electrical engineering from Northwestern University in 1998.  Since August 1998, she has been with the Department of Electrical and Computer Engineering at the University of Wisconsin-Madison, where she currently holds the title of Philip D. Reed Professor. She is also a Faculty Affiliate of the Department of Biomedical Engineering and a member of the Imaging and Radiation Sciences Program within the UW Carbone Cancer Center.

Dr. Hagness’s theoretical and experimental contributions to the field of microwave breast imaging span a wide array of topics, including imaging algorithms, computational electromagnetics modeling, numerical breast phantom development, ultrawideband and multi-band antenna design, experimental prototype development, physical breast phantom design, dielectric spectroscopy, and development of microwave contrast agents. 

She was the recipient of the Presidential Early Career Award for Scientists and Engineers presented by the White House in 2000. In 2002, she was named one of the 100 top young innovators in science and engineering in the world by the MIT Technology Review magazine. She received the 2004 IEEE Engineering in Medicine and Biology Society Early Career Achievement Award, the International Union of Radio Science (URSI) Isaac Koga Gold Medal, the 2007 IEEE Transactions on Biomedical Engineering Outstanding Paper Award, the 2007 IEEE Education Society’s Mac E. Van Valkenburg Early Career Teaching Award, and the 2011 Physics in Medicine and Biology Citations Prize.  She became a Fellow of the IEEE in 2009.  She served as the Technical Program Chair of the 2012 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting in Chicago, IL.


Dylan F. Williams
National Institute of Standards and Technology

Recipient of 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement

"Vector Network Analysis in Printed Transmission Lines"

Wednesday, May 8, 2013

Dylan Williams
Dylan F. Williams (M’80-SM’90-F'02) received a Ph.D. in Electrical Engineering from the University of California, Berkeley in 1986. He joined the Electromagnetic Fields Division of the National Institute of Standards and Technology in 1989.

Dylan pioneered the development of methods for determining the characteristic impedance of printed transmission lines and accurate on-wafer scattering-parameter calibrations. These are still recognized as the calibrations of reference today. Later work led to ways of verifying the accuracy of common industry-developed calibrations and the development of multiport and multi-mode calibrations in printed transmission lines.

Dylan later brought rigor to waveform measurements through the addition of mismatch corrections to electro-optic-sampling calibrations. These mismatch-corrected calibrations accounted for voltages, currents, and impedances, and now provide phase traceability for large-signal network analyzers. Dylan also pioneered the development of uncertainty analyses that included correlations and can be applied to waveform and other mixed temporal and frequency-domain measurement systems. More recently he has been working on extending electrical scattering-parameter measurements to terahertz frequencies in both rectangular waveguide and on-wafer transmission lines.

He has published over 80 technical papers and is a Fellow of the IEEE. He is the recipient of the Department of Commerce Bronze and Silver Medals, the Astin Measurement Science Award, two Electrical Engineering Laboratory's Outstanding Paper Awards, three Automatic RF Techniques Group (ARFTG) Best Paper Awards, the ARFTG Automated Measurements Technology Award, and the IEEE Morris E. Leeds Award. Dylan also served as Editor of the IEEE Transactions on Microwave Theory and Techniques from 2006 to 2010 and is currently the Executive Editor of the IEEE Transactions on Terahertz Science and Technology. Dylan is also the recipient of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.


 

IEEE Non- Discrimination Policy

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"IEEE is committed to the principle that all persons shall have equal access to programs, facilities, services, and employment without regard to personal characteristics not related to ability, performance, or qualification! s as determined by IEEE policy and/or applicable laws."
Learn more about the IEEE non-discrimination policy.

IEEE Event Photography Statement

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"Attendance at, or participation in, this conference constitutes consent to the use and distribution by IEEE of the attendee's image or voice for informational, ! publicity, promotional and/or reporting purposes in print or electronic communications media. No flash photography will be used.

Video recording by participants and other attendees during any portion of the conference is not allowed without special prior written permission of IEEE.

Photographs of copyrighted PowerPoint or other slides are for personal use only and are not to be reproduced or distributed. Do not photograph any such images that are labeled as confidential and/or proprietary."

Student Travel Awards

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A limited number of student travel awards are available for students (graduate and undergraduate) who will be attending and presenting their papers (oral or poster) at the 2013 IEEE Instrumentation and Measurement Technology Conference (I2MTC 2013).  The award may be applied towards the student’s registration fee and allowable travel expenses.  Interested students should submit an Application Form to the I2MTC 2013 Technical Co-Chair, Mr. Jeff Paulson at Jeff.Paulson@bsci.com:

1.    Statement of interest and need, not to exceed 750 words. Longer submissions will not be considered.
2.    An itemized list of travel cost estimates, including the conference registration fee.

Applications will be accepted ONLY through December 15, 2012.  Successful awardees will be informed of the decision of the selection committee by January 31, 2013, at which time the necessary forms will be provided.

Subsequent to providing the requested information, please do not send further inquiries regarding the status of your travel award application. The selection committee may contact an applicant if further clarifications are necessary. 

Without an exception, awardees MUST present their paper/poster at the conference in order to receive the award.

Best Student Poster Awards

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Students interested in entering their paper in the Student Best Poster Awards should indicate their intent by answering affirmative to this question during the extended abstract submission using the EDAS abstract submission system.  There will be two categories:  1) Graduate student, and 2) Undergraduate student.  There will be a 1st place award of $500 and a 2nd place award of $400 given in each category.

Using this pool of extended abstracts, a selection committee will carefully consider the technical quality of the submitted extended abstracts and will select up to ten papers for the final competition. The selected candidates will be informed soon thereafter.

There is no distinction between papers that are presented in a poster or oral session. Therefore, for this purpose these papers will be grouped and presented in the Best Student Poster Competition Session.

A team of up to five unidentified (to the students) judges having read the proceedings papers will visit the students during the poster session to observe their interactions with interested attendees, ask questions about their work, etc. Subsequently, based on several factors including, but not limited to, the technical quality, presentation in the proceedings, poster clarity and quality of presentation and ability of the student to engage in technical discussions will select the First and Second place papers.  The winners will be announced at the Awards Luncheon on Wednesday of the conference week.

The following requirements MUST be satisfied for a paper to be considered for this award:

1.    The paper must be primarily the work of the student candidate, although it may have multiple co-authors. 
2.    The poster must be presented by the student and may not be presented by another person or a co-author.
3.    Only one paper, authored by any given student, may be in the final pool.

**Please note:  If there are not at least 3 papers in a particular category, no award will be given.

Conference Best Paper Awards

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Conference Best Paper Award will be selected based on the initial review process of the extended abstracts followed by reviewing the Proceedings Papers and visitation (by unidentified judges) during the presentation of candidate papers. The final assessment and selection criteria will be based on several key parameters including: technical quality of the paper, authors’ knowledge of the field, presentation effectiveness and clarity, engagement in substantive Q/A, etc. 

The paper MUST be presented by one of its authors. 

The winners of the First and Second place papers will be announced at the Awards Luncheon on Wednesday of the conference week.

Technical Program Committee Members

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Technical Program Chairs:
Jeff Paulson, IMS Twin Cities Chapter, USA
Dr. Sergey Kharkovsky, University of Western Sydney, Australia
Professor Dario Petri, University of Trento, Italy

Technical Program Committee Members:

Mohamed Abou-Khousa   The University of Western Ontario Canada
Mihaela Albu Politehnica University of Bucharest Romania
Leopoldo Angrisani University of Naples Federico II Italy
Salvatore Baglio University of Catania Italy
Kurt Barbe Vrije Universiteit Brussel Belgium
David Baudry CESI - Centre de Rouen France
Niclas Bjorsell University of Gavle Sweden
Jean-Charles   Bolomey Supelec France
Anatoliy Boryssenko A&E Partnership USA
Georg Brasseur Graz University of Technology Austria
Luca Callegaro INRIM - Istituto Nazionale di Ricerca Metrologica Italy
Paolo Carbone University of Perugia Italy
Andrea Cataldo University of Salento Italy
Marcantonio Catelani University of Florence Italy
Chien-In Henry Chen Wright State University USA
Fong Zhi Chen Instrument Technology Research Center, National Applied Research Laboratories Taiwan
Donyau Chiang Instrument Technology Research Center Taiwan
Lorenzo Ciani University of Florence Italy
Ana-Maria Cretu University of Quebec Canada
Loredana Cristaldi Politecnico di Milano Italy
Gabriele D'Antona Politecnico di Milano Italy
Dominique Dallet Laboratoire de l'Intégration du Matériau au Système France
Pasquale Daponte University of Sannio Italy
Serge Demidenko RMIT International University Vietnam
Alessandro Depari University of Brescia Italy
Dennis Destefan Fluke Calibration USA
Kristen Donnell Missouri University of Science and Technology USA
Ruth Dyer Kansas State University USA
Hartmut Ewald University of Rostok Germany
Alessandro Ferrero Politecnico di Milano Italy
Alessandra Flammini University of Brescia Italy
Ada Fort University of Siena Italy
Kim Fowler Kansas State University USA
Mohammad Tayeb Ghasr Missouri University of Science and Technology USA
Robert Goldberg Independent consulting USA
Ron Goldfarb National Institute of Standards and Technology USA
Nachappa Gopalsami Argonne National Laboratory USA
Rafik Goubran Carleton University Canada
Domenico Grimaldi University of Calabria Italy
Andrea Guerriero Politecnico di Bari Italy
Upul Gunawardana University of Western Sydney Australia
Chi-Hung Hwang Instrument Technology Research Center Taiwan
Carmine Landi Second University of Naples Italy
Theodore Laopoulos Aristotle University of Thessaloniki Greece
Tuami Lasri Institut d'Electronique de Microélectronique et de Nanotechnologie France
Fu Li Portland State University USA
Zheng Liu Institute for Research in Construction, National Research Council Canada Canada
Ranjith Liyanapathirana University of Western Sydney Australia
Antonello Monti RWTH Aachen University Germany
Rosario Morello University Mediterranea of Reggio Calabria Italy
Antonio Moschitta University of Perugia Italy
Subhas Mukhopadhyay Massey University (Turitea) New Zealand
Claudio Narduzzi Universita' di Padova Italy
Michele Norgia Politecnico di Milano Italy
Adam Osseiran Edith Cowan University Australia
Matteo Pastorino University of Genoa Italy
Pierre Payeur University of Ottawa Canada
Dias Pereira ESTSetubal/Polytechnic Institute of Setubal Portugal
Lorenzo Peretto University of Bologna Italy
Alessandro Pesatori Politecnico di Milano Italy
Rik Pintelon Vrije Universiteit Brussel Belgium
Vincenzo Piuri University of Milan Italy
Ferdinanda Ponci RWTH Aachen University Germany
Octavian Postolache Institute of Telecomunication - IT/IST Portugal
Yves Rolain Vrije Universiteit Brussel Belgium
Emilio Sardini University of Brescia Italy
Jacob Scharcanski UFRGS Brazil
Gourab Sen Gupta Massey University New Zealand
Antonio Serra IST, Technical University of Lisbon Portugal
Cheng Shanbao Direct Drive System, FMC Technologies USA
Shervin Shirmohammadi   University of Ottawa Canada
V.R. Singh National Physical Laboratory India
Emiliano Sisinni University of Brescia Italy
Bernardo Tellini University of Pisa Italy
Gui Yun Tian Newcastle University United Kingdom
Samir Trabelsi Richard B. Russell Agricultural Research Center USA
Antonios Tsourdos Cranfield University United Kingdom
Ahmet Turkmen University of Wisconsin, Stout USA
Jesus Urena University of Alcala Spain
Michele Vadursi University of Naples "Parthenope" Italy
Wendy Van Moer Vrije Universiteit Brussel Belgium
Robert Whitney Robert Whitney & Associates USA
Ruqiang Yan Southeast University P.R. China
Yong Yan University of Kent United Kingdom
Mark Yeary University of Oklahoma USA
Maciej Zawodniok Missouri University of Science and Technology USA

 
Reviewers:

Rami Abielmona Larus Technologies Corporation Canada
Rini Akmeliawati International Islamic University Pakistan
Bruno Andò University of Catania Italy
Giuseppe Andreoni Politecnico di Milano Italy
Giovanni Betta University of Cassino Italy
Vedran Bilas University of Zagreb Croatia
Thierry Bosch National Polytechnica Toulouse France
Markus Brandner Graz University of Technology Austria
Thomas Bretterklieber Graz University of Technology Austria
David Capson University of Victoria Canada
Joseph Case Missouri University of Science and Technology USA
Franjo Cecelja University of Surrey UK
Tomasz Chady West Pomeranian University of Technology Poland
Xiyuan Chen Southeast University China
Cheng-Hsin Chuang Southern Taiwan University Taiwan
Vladimir Cretu Politehnica University of Timisoara Romania
Angel Cuadras Universitat Politècnica de Catalunya Spain
Sunil Das University of Ottawa Canada
Carlos De Marziani National University of Patagonia San Juan Bosco Argentina
Luca De Vito University of Sannio Italy
Vincenzo Di Lecce Politecnico di Bari Italy
Feng Ding CRIQ Canada
Branislav Djokic National Research Council of Canada Canada
Octavia Dobre Memorial University of Newfoundland Canada
Tadeusz Dobrowiecki Budapest Univ. of Technology and Economics Hungary
Robin Dykstra Victoria University of Wellington New Zealand
Bernd Eichberger Graz University of Technology Austria
Abdulmotaleb El Saddik University of Ottawa Canada
Behzad Elahifar University of Leoben Austria
Halit Eren Curtin University of Technology Australia
Slawomir Ertman Warsaw University of Technology Poland
Marco Faifer Politecnico di Milano Italy
Dragos Falie Universitatea Politehnica Bucuresti Romania
Mojtaba Fallahpour Missouri University of Science and Technology USA
Peter Filipski National Research Council Canada Canada
Anton Fuchs Graz University of Technology Austria
Robert Gao University of Connecticut USA
Juan Carlos García University of Alcala Spain
Leonardo Gasparini Fondazione Bruno Kessler Italy
Manel Gasulla Universitat Politècnica de Catalunya Spain
Giada Giorgi University of Padova Italy
Liesbeth Gommé VeroTech Belgium
Chinthaka Gooneratne King Abdullah University of Science and Technology Saudi Arabia
Voicu Groza University of Ottawa Canada
Deniz Gurkan University of Houston USA
Vladimir Haasz Czech technical university in Prague Czech Republic
Qingbo He University of Science and Technology of China China
Alvaro Hernández University of Alcala Spain
Gert Holler Graz University of Technology Austria
Yueh-Min Huang National Cheng Kung University Taiwan
Satoshi Ikezawa Waseda University Japan
Bernhard Jakoby Johannes Kepler University Linz Austria
Haifeng Ji Zhejiang University China
Xi Ju General Motors Research & Development USA
Julian Kähler University of Technology TU Braunschweig Germany
Michael Karner Virtual Vehicle Germany
István Kollár Budapest University of Technology and Economics Hungary
Jan Krabicka University of Greenwich UK
Wlodek Kulesza Blekinge Institute of Technology Sweden
Arun Kumar Singapore Polytechnic Singapore
Marco Laracca  University of Cassino and Southern Lazio  Italy
Bernhard  Lechner  Virtual Vehicle  Germany 
George  Lee  Wright State University  USA 
Erich  Leitgeb  Graz University of Technology Austria 
Consolatina  Liguori  University of Salerno  Italy 
Peter  Liu  Carleton University  Canada 
Fernando  Lopez Peña  University of A Coruña  Spain
Gang  Lu  University of Kent UK
Euler  Macedo Federal University of Paraíba  Brazil 
Anssi  Mäkynen University of Oulu  Finland
Aamir  Malik  Universiti Teknologi Petronas  Malaysia 
Francisco  Martín  University of Oviedo  Spain 
Gilles  Mauris  Université de Savoie  France 
Gianfranco  Miele  University of Cassino  Italy 
Mart  Min  Tallinn University of Technology  Estonia 
Marco  Mugnaini  University of Siena  Italy 
Ioan  Nafornita  Politehnica University of Timisoara  Romania 
Markus  Neumayer  Graz University of Technology  Austria 
Jan  Obrzut  National Institute of Standards and Technology  USA
Melanie  Ooi  Monash University  Australia 
Andreas  Opelt  Infonova  Austria 
Roberto  Ottoboni  Politecnico di Milano  Italy 
Sethuraman  Panchanathan  Arizona State University  USA 
Marco  Parvis  Politecnico di Torino  Italy 
Michael  Paulweber  AVL List GmbH  Austria
Antonio  Pietrosanto  University of Salerno  Italy 
Radu-Emil  Precup  Politehnica University of Timisoara  Romania 
Sergio  Rapuano  University of Sannio  Italy 
Leon  Reznik  Rochester Institute of Technology  USA 
Karl-Ragmar  Riemschneider  Hochschule für Angewandte Wissenschaften  Germany 
Daniel  Rosenthal  Teradyne, Inc.  USA 
Xavier  Roset  Polytechnic University of Catalonia  Spain 
Manuel  Roveri  Politecnico di Milano  Italy 
Shubhajit  Roy Chowdhury  Centre for VLSI and Embedded Systems Technology  India 
Imre  Rudas  Óbuda University  Hungary 
Rosario  Schiano Lo Moriello  Università degli Studi di Napoli Italy 
Georg  Schitter  Vienna University of Technology  Austria 
Thomas  Schlegl  Graz University of Technology  Austria 
Johan  Schoukens  Vrije Universiteit Brussel  Belgium 
Christian  Schuss  University of Oulu  Finland 
Sarah  Seguin  University of Kansas  USA 
Minfen  Shen  Shantou University  Canada 
Pedro  Silva Girão   Instituto Superior Técnico  Portugal 
Akash  Singh  IBM  USA 
Jonas  Sjöberg  Chalmers University of Technology  Sweden 
Gerald  Steiner  Graz University of Technology  Austria 
K.  Tashiro  Shinshu University  Japan 
Allan  Tengg  Virtual Vehicle  Germany 
Thomas  Thurner  Graz University of Technology  Austria 
Steven  Tilden  LTX-Credence Corporation USA 
Erik  Timpson  University of Missouri - Columbia  USA 
Sergio  Toscani  Politecnico di Milano  Italy 
Carlo  Trigona  University of Catania  Italy 
Din Ping  Tsai  National Taiwan University  Taiwan 
Anne  Van Mulders  Vrije Universiteit Brussel  Belgium 
Laurent  Vanbeylen  Vrije Universiteit Brussel  Belgium 
Gerd  Vandersteen  Vrije Universiteit Brussel  Belgium 
Annamaria  Varkonyi-Koczy  Obuda University  Hungary 
Valerio  Vignoli  University of Siena  Italy 
Christian  Vogel  Telecommunications Research Center Vienna (FTW)  Austria
Baoliang  Wang Zhejiang University  China 
Chao  Wang  Tianjin University  China 
Huaxiang  Wang  Tianjin University  China 
Xue  Wang  Tsinghua University  China
Yicheng  Want  NIST  USA 
Daniel  Watzenig  Graz University of Technology  Austria 
Qiao  Xiang  Wayne State University  USA 
Gaozhi (George)  Xiao  National Research Council Canada  Canada 
Lijun  Xu  Beihang University  China 
Wuliang  Yin  University of Manchester  UK 
Chung-Ping  Young  National Cheng Kung University  Taiwan 
Bernhard  Zagar  University of Linz  Austria 
Hubert  Zangl  Graz University of Technology  Austria
Josef  Zehetner  Virtual Vehicle Germany 
George  Zentai  Varian Medical Systems  USA 
Hongjian  Zhang  Zhejiang University  China 
Jiying  Zhao  University of Ottawa  Canada